like there are differential signals going all over...

like there are differential signals going all over the place even with some length matching. gotta be at the picosecond level.

Like 23 June at 0:23 | Open on mastodon.social

2 comments

Tube❄️Time

ahh, the HP Journal delivers! these are chips from the HP 54720/10 oscilloscope. the 1DX3 is a dual 7-bit (8-bit?) ADC and the 1DX4 is the front-end sampler and timing generator.

(https://vtda.org/pubs/HP_Journal/HP_Journal_1993-10.pdf pg 74).

(H/T SiliconInsider)

The performance of the probe fixture has been demonstrated
by performing automatic wafer testing of the HP 54720/10
sampler 1C (1DX4) in a typical manufacturing test environment. A similar probe fixture has been designed but not yet
demonstrated for the other important HP 54720/10 data acquisition IC, the 1DX3 dual 7-bit ADC. Since the 1DX4 (along
with two 1DX3s) is mounted in a costly hybrid assembly,
at-speed wafer testing of this circuit is greatly desired. Results of the 1DX4 wafer test demonstration show that the
probe fixture allows automated at-speed testing of a high performance data acquisition circuit by providing convenient
and low-loss interfacing of signals up to the circuit's full
operating speed.
The 1DX4 is a fully custom, mixed-signal, 128-pad, 2-Hz bandwidth bipolar integrated circuit. The 1DX4 is the frontend data sampler and the clock and timing generator of the
high-speed data acquisition system incorporated in the HP
54720/10 oscilloscope. The HP 54720/10 data acquisition
system is described in more detail in the article on page 11
and in reference 2.

24 June at 4:26 | Open on mastodon.social

Darryl Ramm

@tubetime

HP Journal now would have articles about how great their marketing weenies are for trapping clueless customers in their subscription printing scams.

Oh I wish Keysight had managed to keep the Hewlett-Packard name.

24 June at 4:47 | Open on hachyderm.io

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