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Tube❄️Time

ahh, the HP Journal delivers! these are chips from the HP 54720/10 oscilloscope. the 1DX3 is a dual 7-bit (8-bit?) ADC and the 1DX4 is the front-end sampler and timing generator.

(vtda.org/pubs/HP_Journal/HP_Jo pg 74).

(H/T SiliconInsider)

The performance of the probe fixture has been demonstrated
by performing automatic wafer testing of the HP 54720/10
sampler 1C (1DX4) in a typical manufacturing test environment. A similar probe fixture has been designed but not yet
demonstrated for the other important HP 54720/10 data acquisition IC, the 1DX3 dual 7-bit ADC. Since the 1DX4 (along
with two 1DX3s) is mounted in a costly hybrid assembly,
at-speed wafer testing of this circuit is greatly desired. Results of the 1DX4 wafer test demonstration show that the
probe fixture allows automated at-speed testing of a high performance data acquisition circuit by providing convenient
and low-loss interfacing of signals up to the circuit's full
operating speed.
The 1DX4 is a fully custom, mixed-signal, 128-pad, 2-Hz bandwidth bipolar integrated circuit. The 1DX4 is the frontend data sampler and the clock and timing generator of the
high-speed data acquisition system incorporated in the HP
54720/10 oscilloscope. The HP 54720/10 data acquisition
system is described in more detail in the article on page 11
and in reference 2.
1 comment
Darryl Ramm

@tubetime

HP Journal now would have articles about how great their marketing weenies are for trapping clueless customers in their subscription printing scams.

Oh I wish Keysight had managed to keep the Hewlett-Packard name.

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